How to analyse layers and coatings with Raman spectroscopy, with the example of paint on coated metal.
Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and… read more →
Measuring homogeneity, cleanliness, oxygen content and more for process and quality control in the metals industry.
With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.
Register now for our Bruker XRD User Meeting on 12-13 June 2019 at Uppsala University in Sweden.
An explanation of helical micro-CT (spiral scanning) and how it’s used in materials science and orthopedic research.
How Raman spectroscopy is used in the development of photovoltaics and solar cells.
New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.
Multi-element analysis for refineries and oil manufacturers. Less expensive than WDXRF, with the same analytical performance.