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Bruker Dimension Icon

Atomic Force Microscopy

Bruker Dimension Icon

Powerful, versatile atomic force microscope

Powerful large sample AFM (atomic force microscopy) imaging for a broad range of applications.

  • Highest performance on any AFM sample
  • Widest range of AFM modes and applications
  • Quantitative nanoscale material property mapping
  • Simultaneous nanoscale imaging and nanomechanical analysis

The Dimension Icon Atomic Force Microscope brings new levels of performance, functionality and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the revolutionary Dimension Icon delivers lowest drift and lowest noise, for artefact-free images in minutes rather than hours.

The Dimension Icon AFM is powered by Bruker’s proprietary PeakForce Tapping technology. Perform nanoscale imaging, while simultaneously capturing nanomechanical material information. The Icon AFM makes this technology accessible to all user levels. ScanAsyst automatic image optimisation makes it easy to perform surface characterisation on any sample size, as well as multiple samples and sample types.

Contact us for more information and quotes:
+44 (0)1223 422 269 or info@blue-scientific.com

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Bruker Dimension Icon AFM

Bruker Dimension Icon AFM

 

Applications

  • Material mapping – Map nanomechanical properties while simultaneously imaging topography at high resolution – More info – Example case study
  • Electrical characterisation at the nanoscale with greater sensitivity and dynamic range using proprietary modes, and combine with other techniques, including PeakForce SECM
  • Nanomanipulation – Perform manipulation and lithography at nanometre and molecular scale.
  • Heating and cooling – Temperature control and thermal analysis from –35°C to 250°C, or sub-100nm local heating to 400°C using a thermal probe.

Benefits

  • Ultimate performance
  • Immediate research-quality results
  • Easy to use, with expert functionality
  • Full suite of AFM modes
  • Lower noise floor and higher accuracy than any other large sample AFM

The Dimension Icon incorporates the latest industry-leading nanoscale imaging and characterisation technology on a large sample tip-scanning AFM platform.

Bruker Dimension Icon AFMUltimate Performance

  • Temperature-compensating position sensors reduce noise levels to the sub-angstroms range for the Z-axis, and angstroms in X-Y.
  • Significantly reduced noise floor at less than 30pm for imaging at sub-nanometer resolution.
  • Drift rates of less than 200pm per minute render distortion-free images immediately.

Enhanced Nanoscale Automation

Bruker’s new AutoMET™ software uniquely combines high-resolution AFM imaging with fast, automated metrology. It is easy to use and flexible, for critical-to-quality measurements in high-volume measurement applications. AutoMET includes an intuitive and simple recipe-writing environment, so complex workflows can be transformed into simple, push-button operations.

Exceptional Productivity

  • Integrated alignment tools for fast probe positioning.
  • High-resolution camera and X-Y positioning permit faster, more efficient sample navigation.
  • ScanAsyst Imaging and NanoScope software with default experiment modes and preconfigured settings.

Versatile and Flexible

  • Wide open access to tip and sample for a wide variety of standard and customised experiments, with holders for large and multiple samples.
  • Access the complete range of AFM modes and techniques.
  • Custom user-programmable scripts offer semi-automated measurement and analysis.

AFM Modes

Nanomechanics Lab – Package for complete nanomechanical characterisation of a wide range of materials

Contact Mode
TappingMode
PhaseImagingTM
ScanAsyst
HarmoniX
PeakForce QNM
PeakForce TUNATM
PeakForce SECM (Scanning Electrochemical Microscopy)
LiftModeTM
Dark Lift
Nano-Indentation

Nanolithography
Nanomanipulation
Force Volume
Piezo Response
Force Modulation
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
Electric Force Microscopy (EFM)
Surface Potential

Scanning Capacitance Microscopy (SCM)
Scanning Spreading Resistance Microscopy (SSRM)
Tunneling Atomic Force Microscopy (TUNA)
Conductive Atomic Force Microscopy (CAFM)
Scanning Tunneling Microscopy (STM)
Torsional Resonance Mode (TRmode)
TR-TUNA
Thermal Analysis (VITA)

PeakForce QNM

Quantitative nanomechanical mapping with simultaneous high resolution imaging:

PeakForce SECM

PeakForce SECM (Scanning Electrochemical Microscopy) is an AFM mode that captures electrochemical data correlated with nanomechanical information, for insights into the relationship between the size, geometry, modulus, adhesion and activity of nanostructured materials.

More about PeakForce SECM

 


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