NEW Bruker Dimension-XR Scanning Probe Microscopes
Bruker Dimension XR is a new series of Scanning Probe Microscopes from Bruker, with models optimised specifically for nanomechanics, electrical AFM and nanoelectrochemistry.
Bruker Dimension XR
Bruker Dimension XR series is a new series of Scanning Probe Microscopes incorporating significant innovations in AFM technology:
- Exclusive DataCube nanoelectrical modes
- AFM-SECM for energy research
- New AFM-nDMA mode
- A world first: Polymer nanomechanics that correlates with bulk dynamic mechanical analysis (DMA) – more info…
The series includes three models, each optimised to suit a different area of research:
Quantify material properties at the nanoscale in air, fluids, electrical and chemically reactive environments.
The Dimension XR Nanomechanics is optimised for characterising the nanomechanical characteristics of materials. It’s fast and quantitative, with these modes:
- AFM-nDMA – more info
- PeakForce QNM
- FASTForce Volume
- FASTForce Volume CR
Dimension XR Nanoelectrical gives you the most complete selection of electrical AFM techniques on a single system, including:
- PeakForce TUNA
- PeakForce KPFM
With Dimension XR NanoEC you can perform in-situ topography scans in an electrochemical environment. A turn-key system for real-time quantitative analysis of local reactivity at the nanoscale.
- Bruker’s exclusive nanoelectrode probes
- PeakForce SECM
If you have any questions or if you’d like a quote, please get in touch.
Blue Scientific is the official Nordic distributor of Bruker AFM in Scandinavia, and we’re here to assist with all your queries: