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Bruker M4 TORNADO PLUS

Bruker Micro XRF

Bruker M4 TORNADOPLUS

World’s first micro-XRF system for light elements down to carbon 

The Bruker M4 TORNADOPLUS is a revolutionary micro-XRF elemental analysis system that – for the first time – can detect and analyse elements from carbon to americium.

  • Analyse light elements down to carbon with 2 large-area silicon drift detectors
  • Faster acquisition with a high throughput pulse processor
  • High depth of field for improved focus on topographic samples
  • Faster sample changing and set-up with new quick-change stage

Optional Features:

  • Second X-ray tube with automatic 4-position collimator changer for greater versatility on high energy lines
  • Programmable He-purge system for analysing light elements at atmospheric pressure

Contact us on +44 (0)1223 422 269 or info@blue-scientific.com for advice and quotes.

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Bruker M4 TORNADO Plus

Applications

  • Mining, minerals & geoscience
  • Life science & metallomics
  • Semiconductors & micro-electronics
  • Quality control
    eg glass, coatings, failure analysis, cement, ceramics

Benefits

  • Light element detection – down to carbon
  • Opens up micro-XRF to new applications
  • Twice the throughput – faster measurements
  • Enhanced depth of field and resolution

Detect Super Light Elements

Conventional micro-XRF spectrometers detect elements from sodium upwards. The M4 TORNADOPLUS extends this range to include elements with atomic numbers Z<11, such as fluorine, oxygen, nitrogen and carbon.

There’s no compromise to the performance or sensitivity in the higher energy ranges.

Using two large-area silicon drift detectors with super light element window and a specifically optimized Rh X-ray tube, the M4 TORNADOPLUS is the first Micro-XRF spectrometer ever to enable the analysis of light elements.

This opens up new applications and possibilities for micro-XRF, including:

  • Geoscience and mining
  • Biology
  • Polymer research
  • Semiconductors

Example: Fluorite and Calcite

There are certain materials that standard micro-XRF systems can’t distinguish between. One such example is fluorite (CaF2) and calcite (CaCO3). They both have calcium as a main component, and what differentiates them is the presence of light elements fluorine and oxygen/carbon. Conventional micro-XRF systems would detect only the calcium, because they can’t detect elements with Z < 11 (sodium).

The new M4 TORNADOPLUS is capable of detecting super light elements with its dual large area detectors and light element X-ray tube. This enables the two minerals to be identified easily, clearly highlighting the fluorine, oxygen and carbon:

Micro-XRF in Geology

Differentiating fluorite and calcite by detecting fluorine and oxygen.

Twice the Throughput – For Faster Measurements

Previous dual detector versions of the M4 TORNADO deliver higher throughput than many micro-XRF systems, with an output count rate of up to 260 kcps, compared to the average 90-100 kcps.

This rate has now been increased even further, processing up to 1,200 kcps for an output count rate of up to 550 kcps. This gives you unprecedented acquisition speed , for greater productivity than ever before.

In cases where high X-ray fluorescence intensities are not possible due to the sample type, the pulse throughput is superior due to the low pulse processor dead time. This means that you benefit in every situation, compared to alternative systems:

  • More data in the same time
  • Same amount of data in less time

Fast Sample Changing

It’s quick and easy to attach and exchange samples with a quick-change stage and removable stage plate. These are also more secure for reanalysis if necessary. Save time with specimen exchange and setting up measurements, knowing that samples will always be at the same height and position.

Special carriers are also available for drill cores and thin sections.

Sample holder for geoscience

Special sample holders for drill cores and thin sections

Enhanced Depth of Field and Resolution

Samples aren’t always completely flat, and samples with topography can pose a challenge in micro-XRF. Standard systems with high resolution X-ray optics (7 µm) need a small working distance around 2 µm, to achieve a depth of field of less than 1 mm.

The M4 TORNADOPLUS  has a software-controlled Aperture Management System (AMS), which gives you a working distance of around 9 mm and a depth of field up to ~5 mm. This maintains a high spatial resolution and keeps sample features in focus, even if the surface height varies by several millimeters.

This opens up micro-XRF to samples with strong topography, which may not have achieved good results before, in fields such as:

  • Electronics
  • Forensics
  • Geoscience

Depth of field

Depth of field with and without AMS (Aperture Management System). On the standard image, tall components and bond wires are out of focus and appear blurred. With a higher depth of field, components are in focus over a larger range of heights and depths.

Second X-Ray Tube Collimator Changer

An optional second fine focus X-ray tube is available, with a software-controlled 4-position collimator changer. This expands the flexibility of the spot size from 500 µm to 4.5 mm.

Easily switch between a smaller collimated spot with lower intensity, and a larger high intensity spot similar to XRF.

This gives you greater flexibility when studying larger structures and high-energy X-ray lines.

Element Mapping Fruit

Mosaic image and single element maps of a strawberry, taken with He-purge.

Multi-Functional Computer-Controlled He-Purge – analyze light elements without vacuum

Some samples are pressure-sensitive or at risk of drying out. This causes issues for measurements under a vacuum. Working in ambient air is possible, but X-ray fluorescence from light elements below Ca can be strongly attenuated or even completely absorbed.

For light and super light elements down to carbon and vacuum-sensitive samples, an optional, computer-controlled He-purge system is available that extends the analysis range under atmospheric pressure. There are two purging modes to suit your analytical requirements.

In most cases, local high-flow purging at the measurement position is enough to acquire low energy X-rays for quick single or multi-point analysis.

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