Bruker S4 TStar
Powerful Ultra Trace Element Analysis with TXRF
TXRF (Total reflection X-ray fluorescence) spectroscopy is an established technique for trace element analysis, suitable for a wide variety of samples. The S4 TStar simplifies TXRF, with features for 24/7 routine operation and guaranteed data quality, making it an attractive alternative to ICP.
- Low sub-ppb detection limits
- Flexible and versatile – analyse a wide variety of samples
- Automatic quality control features
- 24/7 operation for overnight industrial routine analysis
- Multi-user operation and 90 sample capacity
- Selection of tools for fast sample preparation, minimising errors and contamination
Cost-Effective Alternative to ICP
TXRF is a fast and cost-effective alternative to ICP analysis. Where ICP requires fully dissolved liquid samples, the S4 TStar can analyse a wide variety of sample types. Various carriers and tools are available for different samples, making preparation easier and quicker than ICP.
Ultra trace analysis you can rely on, to comply with regulations in a variety of fields. If your area of work is not mentioned here, please get in touch.
Pharmaceutical Trace Analysis
Detect catalyzer elements in active pharmaceutical ingredients (API): < 0.1/0.5 ppm Pd in liquids or pills. Comply with upcoming US and EU Pharmacopeia guidelines.
Food safety according to FAO/WHO standards eg directly analyse As levels in rice, as low as < 40 ppb. Prevent fraud and ensure product safety in globalised supply chains.
Maintain a healthy environment by monitoring contaminants in water, effluent, air and soil. < 10 ppb detection of contaminants in wastewater, slurries and effluent.
Identifying Illegal Mining
The S4 TStar was used in an operation by the Brazilian Federal Police to identify illegal mining activities and defend the Amazon’s unique natural environment:
Automatic QC Procedures
The Bruker S4 TStar is the first TXRF spectrometer that runs QC routines automatically to qualify operation and performance in the background, ensuring data quality. Automatic stability and sensitivity checks are run with integrated QA samples.
Minimise Sample Contamination
Bruker’s SampleCare™ protects samples and improves data quality. Reduced air flow and integrated sample housing minimises the risk of contamination. A slight stream of nitrogen shields the samples, and removes argon from the air for improved detection of palladium and silver.
Convenient Sample Control and Archiving
Control the quality of your sample with a magnified image from a CCD camera. All sample images are archived automatically for review.
The S4 TStar sample changer has a high capacity of up to 90 sample discs. Automated batch processing is available, so you can measure samples overnight. The TStar is designed for multi-user operation, with up to 10 different trays. These can be loaded and unloaded while the instrument is running.
Easyload™ Sample Station
Dedicated sample trays are available for different types of samples. These are recognised automatically, for efficiency and to prevent errors. All open measurement jobs can be started immediately, increasing throughput and speed.
Trays can be stored in stackable boxes, to prevent contamination. Centre markings on the bottom plate allow direct pipetting of any sample without touching the sample carrier.
Final Results on the Spot
Typically, samples are prepared multiple times. Straight after measurement, statistical data is reported automatically (average, standard deviation etc.). Standard libraries allow the determination of recoveries. Any deviations from the admissible tolerance are highlighted for you.
The S4 TStar has a high capacity of 90 samples. A wide variety of carriers is available for a various sample types:
30 mm Quartz Discs
Quartz discs for elemental analysis of liquids, solids and suspensions.
2” wafers for contamination analysis, depth profiling and material sciences research.
Microscopy slides forclinical and biological samples,and direct analysis of cell cultures, smears and thin sections.
Rectangular carriers up to 54 mm for TXRF analysis of films, filters and nanoparticle layers; any customised reflective media.