NanoWizard 4 NanoScience
AFM for materials and polymers research
The Bruker JPK NanoWizard 4 NanoScience is a flexible AFM for environmental control, mapping nanomechanical, electrical, magnetic or thermal properties and integration with advanced optical techniques.
- Fast scanning – ideal for tracking dynamic processes
- Easy high resolution quantitative imaging
- Mechanical and electrical characterisation
- Wide choice of modes and accessories
- Flexible, modular system for a range of applications
Fast Scanning – Ideal for Dynamic Processes
The NanoWizard 4 NanoScience gives you closed-loop atomic resolution with fast scanning at up to 3 sec onds per image, with a large scan range of 100µm in XY. It has the lowest noise levels of a closed-loop scanner and deflection detection system.
- Examine more sample areas in same time
- Perform quick surveys
- Observe changes following sample dynamics in real time
- Time lapse studies on polymers, thin films, advanced materials, capsules, etc
Quantitative Characterisation of Mechanical Properties
Benefit from a full range of methods for characterising mechanical properties. This includes modes for very soft, delicate samples and materials under an external load eg mechanical tension with the stretching stage.
A full set of quantitative data is collected for every pixel, so you can extract quantitative data including elasticity, adhesion, dissipation, chemical forces and conductivity.
Z-adjustment is automated, especially for swelling samples and rough topography.With enhanced data analysis capabilities you can perform powerful calculations including modulus, with a variety of models.
- Advanced QI mode with Contact Point Imaging (CPI)
- Sample properties under external mechanical tension
- Contact resonance imaging
- Higher harmonics with AM, PM and FM
- Force modulation
- Friction force microscopy
- Fast force mapping
- Single molecule force spectroscopy with ramp & clamp
- Colloidal probe
Material Property Mapping
Characterise electrical, electromechanical and magnetic properties, even on loosely attached, brittle and soft samples.
The Conductive AFM and Kelvin Probe (KPM) modules feature an enclosed volume so you can control the gas environment, for even more testing possibilities.
In addition to this, there are also enhanced STM, Piezo-Response (PFM), Scanning-Thermal AFM and electrochemical mapping (SECM) options.
Material Property Characterisation
- Mechanical properties (elasticity, stiffness, adhesion, deformation)
- Electrical properties with Electrical Force Microscopy, Conductive-AFM, Kelvin Probe AFM (KPM), Scanning Tunneling Microscopy (STM)
- Magnetic properties with MFM
- Electro-optical properties with photo-conductive AFM
- Local thermal properties by scanning thermal AFM
In-Situ AFM with External Loads
Observe how external loads affect sample properties.
- Piezo-Response Microscopy with high Voltages (PFM)
- Stretching stage
- Apply external magnetic fields
- Electro-chemistry and scanning electrochemistry (SECM)
- Heating from ambient up to 300°C
- Cooling from ambient down to – 35°C
- Cryo-AFM down to – 150°C
- Experiments in fluids, including harsh fluids
- Controlled gas flow
- Demanding environments in a glove box
- Inverted optical microscope integration
- High resolution side-views samples
- Upright optical microscope integration
- Fluorescence and confocal integration
- Optical super-resolution combination (STED, TIRF, PALM/STORM)
- Fluorescence spectroscopy (FLIM, FRET, FCS, FRAP, etc)
- Raman experiments, including TERS
- Near field optical experiments