How nanoscale infrared spectroscopy can be used to measure semiconductor materials in defect and contamination analysis, and fabrication.
Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.
We’re now the official distributor for Bruker Anasys nanoscale infrared spectroscopy & thermal measurement instruments in the Nordic region (Denmark, Sweden, Finland, Iceland & Norway).
Bruker webinar about Peakforce SECM (Scanning Electrochemical Microscopy), a new AFM mode with less than 100 nanometre spacial resolution.
Come to our AFM workshop on Thursday 17th March 2016 at DFM (Danish National Metrology Institute) in Denmark.
A new instrument from Anasys Instruments is the only nanoscale IR spectroscopy and imaging platform with both robust nanoscale IR absorption spectroscopy via AFM-IR and sub-20nm complex optical property imaging via sSNOM… read more →
AFM-IR can be used to study nanoscale protein secondary structure. This method provides valuable insights into biologically important macromolecules, which are not available using other analytical techniques. Blue Scientific is the exclusive distributor for Anasys… read more →
Dow Fellow Dr Gregory Meyers will present an invited talk about AFM based nanoscale IR spectroscopy on polymer blends and films at ISPAC 2015, the 28th International Symposium on Polymer Analysis… read more →