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Category Archive for ‘AFM’

Fast AFM

Fast AFM with the Bruker Dimension FastScan

How Bruker have accelerated AFM without compromising image quality – with examples of screening, dynamics and surveying an overview of your sample.

Bruker Nordic Service

Official Service Partner for Bruker AXS and Nano Surfaces (Nordic Region)

We’re now the official service partner for Bruker in the Nordic region, for their X-Ray Analysis and Nano Surface Analysis product lines. In line with this agreement, we’ve expanded with a team of service engineers based regionally across the Nordic countries.  Bruker X-Ray Analysis  Bruker Nano Surface Analysis  Contact us on +44 (0)1223 422 269 […]

NEW Bruker Dimension-XR Scanning Probe Microscopes

New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.

Bruker AFM-nDMA

NEW: Viscoelastic AFM Measurements matching Bulk DMA (AFM-nDMA)

New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.

JPK Instruments (Bruker Nano)

Biological AFM and Microscopy Systems from JPK Instruments / Bruker

An overview of the range of biological microscopy systems from JPK Instruments, now part of Bruker Nano Surfaces.

KPFM AFM

High Resolution KPFM with Bruker PeakForce KPFM

How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).

Bruker PeakForce TUNA AFM

Nanoscale Electrical and Mechanical Property Mapping with AFM

How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.

Nordic SPM Conference 2018

Nordic SPM Conference & User Meeting 2018: 10-11 October 2018

Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.

Bruker NanoElectrical Lab

Electrical AFM Techniques – Bruker NanoElectrical Lab

Bruker NanoElectrical Lab is a package of nanoelectrical AFM techniques, with new DataCube modes. Complete materials characterisation & simultaneous acquisition of mechanical & electrical data. Official Nordic distributor.

Surface Characterisation Conference – 5-6 March 2018, Denmark

Visit us at the Surface Characterisation Conference in Denmark.