Join Physical Electronics’ webinar on Thursday 25th April 2019 to find out how to perform XPS, Auger and TOF-SIMS surface analysis on insulators and non-conducting materials in a wide range… read more →
Join Physical Electronics for a webinar about analysing organic surfaces with TOF-SIMs and XPS.
Join PHI for a lunchtime seminar about XPS and TOF-SIMS (all welcome), as well as a user reception at AVS 65 in Long Beach.
Join Physical Electronics for a webinar about how TOF-SIMS MS/MS imaging provides spectra that are easier to interpret, opening up the technique to applications in industry.
Join PHI for a webinar about how Tandem MS makes accurate molecular identification quicker and easier.
The evolution of TOF-SIMS, and how the new parallel imaging MS/MS from PHI overcomes these limitations, enhancing resolution and overcoming ambiguity.
A scientific paper has been published about TOF-SIMS parallel imaging MS/MS, using the new PHI nanoTOF II. This ground-breaking new technique enables tandem mass spectrometry with sub-micron spatial resolution for… read more →
TOF-SIMS peaks can now be identified unambiguously, with parallel MS/MS imaging with the new PHI nanoTOF II. Video interview with Maastricht University, where the first parallel imaging TOF-SIMS is installed.