X-ray diffraction (XRD) is a powerful analytical technique suitable for analysing a material’s bulk physical properties, such as crystalline structure and phase composition. It is commonly used in research and industry as XRD helps scientists characterise solid solutions, identify patterns, and many other applications. A wide range of XRD instruments are available for researchers to […]
Depth profiling is a pivotal technique in materials science, offering insights into the vertical distribution of elements or chemical species within a sample. This process, crucial for understanding a material’s composition and structure, involves analyzing the surface layer and progressively removing material layer by layer. This blog post delves into the intricacies of depth profiling, […]
Total-reflection X-ray fluorescence (TXRF) is not just another acronym in the vast landscape of materials science. It’s a game-changer. When it comes to achieving higher sensitivity, lower detection limits, and reduced background noise in X-ray fluorescence analysis, TXRF stands out as a premier technique. But what makes it so special, and where is it most […]
Manufacturing processes are evolving continuously to meet customers’ demands for specific products and quality. Amidst this technological evolution, film thickness stands out as a pivotal factor influencing a product’s properties and performance. This article delves deep the significance of film thickness, offering insights into its role in various types of manufacturing processes. 1. The Role […]
Thin films are widely used in a range of applications, including integrated circuits, optical coatings, and solar cells. Characterising the mechanical properties of thin films is essential for understanding their behaviour and optimising their performance in those applications. In this blog post, we will explore why a triboindenter is the ideal tool for characterising thin […]
Cathodoluminescence microscopy is a powerful technique used for semiconductor analysis at the nanoscale. It involves the stimulation of a sample with a high-energy electron beam in an electron microscope, which results in the emission of light or photons known as cathodoluminescence (CL). This technique surpasses the limitations of optical microscopes by providing sub-nanometer spatial resolution, […]
Scanning Electron Microscopy (SEM) plays a vital role in scientific research and several industries. It allows researchers to study samples at high magnifications, which provides useful insights into their composition, microstructure, and surface characteristics. SEM has become an invaluable tool for applications such as quality control in materials science, nanotechnology, and life sciences industries. There […]
Introducing the next-generation 3D surface measurement solution from Bruker: Contour X-1000 3D Optical Profilometer! This floor standing white light interferometer (WLI) is equipped with their exclusive interferometry technology and capable of complete automation. It can also: Extends the unmatched measurement and imaging capabilities Ensures extreme accuracy and reliability Integrates Bruker’s most user-friendly measurement and analysis […]
We love a NEW product, don’t you? Introducing the new NPFLEX-1000 from Bruker This new optical profiler is a floor standing white light interferometer (WLI) that offers the most accurate and flexible solution for evaluating nano-to-macro features on large parts in precision machining. Designed to accommodate the widest variety of sample size and shapes with […]
Ultra-wide bandgap (UWBG) semiconductors are garnering significant interest in the field of materials science due to their promising electrical and thermal properties. However, challenges persist in material quality and fabrication. This blog post will discuss the promise of UWBG semiconductors, the roadblocks to their implementation, and how analytical technologies – particularly cathodoluminescence (CL) – can […]
