Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.
Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and… read more →
Measuring homogeneity, cleanliness, oxygen content and more for process and quality control in the metals industry.
With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.
Register now for our Bruker XRD User Meeting on 12-13 June 2019 at Uppsala University in Sweden.
We’re now the official service partner for Bruker in the Nordic region, for their X-Ray Analysis and Nano Surface Analysis product lines. In line with this agreement, we’ve expanded with… read more →
Trace element detection and analysis with WDXRF, for power plants, metal production and other industrial processes.
Multi-element analysis for refineries and oil manufacturers. Less expensive than WDXRF, with the same analytical performance.
Bruker SC-XRD webinar on 11 October 2018 about automated crystal handling in protein crystallography with the D8 VENTURE and SCOUT.
Join Bruker for an SC-XRD webinar about how to collect better structure analysis data with their new IDEAL software module for APEX3.