Join Physical Electronics for a webinar about analysing organic surfaces with TOF-SIMs and XPS.
Register now for the PHI User Meeting 2018 and Data Reduction Training for XPS, Auger and TOF-SIMS.
Find out more about Physical Electronics’ new XPS/HAXPES Scanning Microprobe in their webinar on 7th December.
A paper has been published about research into the tribochemistry of fuels/biofuels and how the addition of unsaturated fatty acids affects their lubrication. This work involved XPS research with a… read more →
SXI is a powerful and unique tool for XPS surface analysis, particularly useful when examining small sample features such as defects and contaminations.
New and updated VersaProbe III scanning XPS microprobefrom Physical Electronics, with 2-3 times higher sensitivity at all beam sizes compared to the previous model.
TOF-SIMS (Time-Of-Flight Secondary Ion Mass Spectrometry) is a powerful surface analysis technique, providing valuable information about a range of materials. In this article we take a closer look at the technique and how TOF-SIMS works.
Talks about XPS surface analysis from Dr John Hammond, a specialist from Physical Electronics (PHI) USA at our seminar on Tuesday 5th January 2016 at the University of Warwick.
Talks about XPS, scanning Auger and TOF-SIMS surface analysis from Dr John Hammond, a specialist from Physical Electronics (PHI) USA at our seminar on Thursday 7th January 2016 at Tyndall National Institute in Cork, Ireland.