How to Improve EDS Data for In-Situ Liquid TEM

How to maximise signal collection for the highest quality EDS data in your in-situ liquid TEM experiments. Perform EDS elemental analysis in your electron microscope while simultaneously acquiring in situ data and videos.

With optimised EDS chips, you can enhance your TEM’s performance and ensure you’re collecting the best possible data for EDS maps. The new chips make also EDS analysis available at any time throughout your entire experiment.

Compatible with both the current and older models of the Protochips Poseidon in-situ system. The Poseidon can be used with any TEM to add in-situ liquid microscopy capabilities.

EDS Chips

Blue Scientific is the official distributor of Protochips in the UK and Ireland. If you have any questions or if you’d like a quote, please get in touch:

Protochips Poseidon In-Situ System

 Contact us on 01223 422 269 or


Rich EDS Maps

Performing EDS elemental analysis while simultaneously acquiring in-situ data and videos enables you to investigate structural, chemical and morphological changes at the nanoscale, in real time.

The new E-chips for the Protochips Poseidon Select give you a significant advantage over the standard E-chips in EDS experiments. EDS signal collection is greatly improved, with much less shadowing on the detector. Performance is significantly improved, even at 0° tilt.

You can acquire rich, dense EDS maps at any tilt range for applications including tomography, crystallography and electrochemistry.

  • High throughput EDS
  • All EDS geometries
  • Flexible experiments – use EDS at any time

Reliable Chips

The new EDS optimised chips have the same simple holder assembly as the standard chips. With reduced chip material, they are as safe and reliable as all Protochips E-chips, with the added benefit of improved EDS performance.

Improved Count Per Second

Count Per Second (CPS) is improved by up to six times compared to standard E-chips (depending on the detector configuration). This shortens acquisition times, for higher throughput and time efficiency.

EDS When You Need It

EDS elemental analysis is available at any time throughout your experiment. Acquire results whenever you need them, at the click of a button, even at 0º tilt.

This opens up a whole range of possibilities to enhance your research:

  • Acquire EDS data to check your experiment is running as planned
  • Collect spectra to investigate unknown reactants in situ
EDS tilt

Higher count rates (CPS) give you better quality data. The new chips optimise CPS even at 0º tilt.

How to Get the Best EDS Data

EDS is becoming standard practice in in-situ microscopy, but there are several important factors that can affect the quality of your results:

  • Counts per second
  • Detector shadowing
  • Non-characteristic fluorescence

Counts Per Second (CPS)

This is the most important factor for high quality data. The more X-rays that are collected, the better the EDS results. CPS can be maximised by using detectors with larger collection angles or multiple detectors. Streamlined in-situ holders and MEMS devices that minimise obstructions also improve CPS. The new EDS chips improve CPS by up to 6 times, depending on your configuration – contact us for details.

EDS Counts Per Second

Higher counts per second give you better quality data.

Detector Shadowing

A direct line of sight between the sample and detector is important for collecting X-rays efficiently. Sample geometry, pole piece gap, sample tilt and holder geometry can all block X-rays from reaching the detector. If the detector is shadowed, the CPS is reduced or sometimes completely eliminated, even though some non-characteristic counts may still be detected from fluorescence. The new window e-chips significantly reduce shadowing, to maximise your count at any tilt.

EDS chips line of sight

Standard chips can obstruct the line of sight, limiting the amount of X-rays collected by the detector. EDS chips optimise the line of sight to give you the best results.

Non-Characteristic Fluorescence

Scattered electrons and reflected X-rays can create secondary X-rays. This can make the detector pick up elements such as Fe, Cu and Si, even when the detector is shadowed. For accurate results, it’s important to collect only characteristic X-rays for your EDS maps.

EDS with non-characteristic X-rays

Non-characteristic X-rays obscure your EDS spectra and give you false results.

Further Information

For more information and quotes, please get in touch. Blue Scientific is the official UK distributor for Protochips, and we can provide both chips and the Poseidon system for your current or new TEM. We’re available to help with all your questions, as well as demonstrations and quotes:

Protochips Poseidon Select

 Contact us on 01223 422 269 or

Protochips Poseidon Select

Protochips Poseidon in-situ system