In-Situ TEM & Electrical Characterisation Workshop 28/06/19

Join us for a workshop about in-situ TEM and electrical characterisation on Friday 28th June 2019 at Imperial College London. Discover a new method for preparing lamella on a MEMS chip for in-situ electrical characterisation in your TEM.

Blue Scientific is the official UK and Nordic distributor for Protochips. For more information or quotes, please get in touch.

 Protochips Fusion

 Contact us on +44 (0)1223 422 269 or info@blue-scientific.com

  
Heated nanoparticle
PtCo nanoparticle at 700ºC. Courtesy Oak Ridge National Lab.

In-Situ Electrical Characterisation

When preparing samples for in-situ electrical characterisation, the preparation of lamella on a MEMS chip is usually a cumbersome procedure. However, new E-chips and processes have revolutionised sample preparation so it’s now a feasible workflow for your lab.

Come to the workshop to see live demonstrations and find out all about:

  • In-situ TEM and electrical characterisation
  • Sample preparation
  • How to prepare lamella on a MEMS chip using new procedures

The workshop will include live demonstrations using the Protochips Fusion in-situ heating and electrical biasing system.

Programme

A full programme with descriptions of each session is available here as a pdf.

8:30amRegistration and welcome
9:00amIntroduction to FIB sample prep
10:30amHands-on demonstration of FIB preparation: FIB lift out, transfer, contacting and thinning
12:00pm Lunch
1:30pm Live
demonstration of electrical biasing with the Protochips Fusion
2:30pm Coffee break
2:45pm Protochips Atmosphere in-situ TEM gas cell system and metal organic vapour phase epitaxy inside a TEM under atomic resolution conditions
3:45pm Q&A and open panel discussion
4:30pm Close

 Full Programme

Registration

The date of this event has now passed. For upcoming workshops please see our events listing.

Venue

The workshop will be held at Imperial College London:

Protochips Fusion for electron microscopes

Protochips Fusion

An in-situ system for characterising samples at high temperatures, with simultaneous electrical biasing.

  • Compatible with microscopes from all major manufacturers
  • Real time, nanoscale studies
  • Low currents with attoamp sensitivity

More info…

Further Information

If you have any questions about the workshop or Protochips’ in-situ systems, please get in touch:

 Contact us on +44 (0)1223 422 269 or info@blue-scientific.com

 More about in-situ TEM