In-Situ TEM & Electrical Characterisation Workshop 28/06/19
Join us for a workshop about in-situ TEM and electrical characterisation on Friday 28th June 2019 at Imperial College London. Discover a new method for preparing lamella on a MEMS chip for in-situ electrical characterisation in your TEM.Follow @blue_scientific
In-Situ Electrical Characterisation
When preparing samples for in-situ electrical characterisation, the preparation of lamella on a MEMS chip is usually a cumbersome procedure. However, new E-chips and processes have revolutionised sample preparation so it’s now a feasible workflow for your lab.
Come to the workshop to see live demonstrations and find out all about:
- In-situ TEM and electrical characterisation
- Sample preparation
- How to prepare lamella on a MEMS chip using new procedures
The workshop will include live demonstrations using the Protochips Fusion in-situ heating and electrical biasing system.
A full programme with descriptions of each session is available here as a pdf.
|8:30am||Registration and welcome|
|9:00am||Introduction to FIB sample prep|
|10:30am||Hands-on demonstration of FIB preparation: FIB lift out, transfer, contacting and thinning|
demonstration of electrical biasing with the Protochips Fusion
|2:45pm||Protochips Atmosphere in-situ TEM gas cell system and metal organic vapour phase epitaxy inside a TEM under atomic resolution conditions|
|3:45pm||Q&A and open panel discussion|
The date of this event has now passed. For upcoming workshops please see our events listing.
The workshop will be held at Imperial College London:
An in-situ system for characterising samples at high temperatures, with simultaneous electrical biasing.
- Compatible with microscopes from all major manufacturers
- Real time, nanoscale studies
- Low currents with attoamp sensitivity
If you have any questions about the workshop or Protochips’ in-situ systems, please get in touch: