Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
Bruker webinar on Tuesday 4th September 2018 about Advanced Data Mining in micro-XRF, and how to use HyperMap data cubes.
The world’s first micro-XRF system that can detect and analyse the complete element range from carbon to americium.
How to characterise multilayer films at sub-micron resolution with infrared, using O-PTIR spectroscopy.
All new VersaSTAT potentiostats will now include 2-Amp capabilities as standard.
Unique features from Renishaw for mapping large areas quickly and at high resolution with Raman spectroscopy.
How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.
Visit us at the water, wastewater and environmental monitoring conference, and find out about our TXRF systems for ultra trace element analysis.
How to use your SEM for nanoprobing, with the Imina Nanoprobing Solution. Walk-through of an example measurement on 10 nm CMOS transistors on a semiconductor device.
An introduction to our new partners Photothermal and the mIRage IR microscope, which overcomes the greatest problems of IR spectroscopy.
Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.