Join Bruker for a webinar on 18 October 2018 about in-situ nanomechanical testing in the TEM, including how to observe materials under stress at the nanoscale.
How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
Join Physical Electronics for a webinar about how TOF-SIMS MS/MS imaging provides spectra that are easier to interpret, opening up the technique to applications in industry.
Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.
How mid-IR photothermal spectroscopy opens up infrared to new applications in biology and pharmaceuticals.
With the updated Protochips Atmosphere in-situ system for TEM, you can study samples in any mixture of 3 gases of your choice, including complex gases and vapours.
Visit our partners Imina at ESREF 2018 failure analysis conference in Denmark on 1-5 October 2018.
Visit us at MMC 2019 Microscience Microscopy Congress on 1-4 July 2019 at Manchester Central.
Save time and scan large numbers of micro-CT samples easily with an automated sample changer from Bruker SkyScan.
Capture fast in-situ events and reactions at high resolution with the new Gatan K3 IS electron counting, direct detection TEM camera.