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Bruker XRD


XRD – X-Ray Diffractometer

The Bruker D8 ADVANCE is available in various configurations, to focus on a specific analytical task, or as a multipurpose system:


  • D8 ADVANCE ECO – Full-sized goniometer class powder XRD, under ambient and non-ambient conditions.
  • D8 ADVANCE Twin – Best powder XRD performance. Push-button switching between amorphous and polycrystalline thin film analysis under ambient and non-ambient conditions.
  • D8 ADVANCE Plus – XRD for all sample types, including epitaxial thin films under ambient and non-ambient conditions.

Specific Applications

  • D8 ADVANCE for XRD² – Collect data in both 2Theta and Gamma directions, to study the properties of crystalline materials.
  • D8 ADVANCE for Stress – Measure stress and texture on machined parts, thin films and bulk samples.
  • D8 ADVANCE for Structure Analysis – Gather structural information from X-Ray Powder Diffraction with Rietveld (TOPAS) analysis, diffuse or “total” scattering (PDF analysis) and Small Angle X-Ray Scattering (SAXS).

Contact us for more information and quotes:
01223 422 269 or

Bruker D8 Advance


  • Powder XRD
  • Thin films and coatings
  • Crystalline materials
  • Stress and texture
  • Structural analysis
  • Geology and mineralogy – more info


  • Configurations to suit every application
  • Flexible, modular instrument
  • Automatic optimisation features for the highest quality data
  • Solid, maintenance-free goniometer
  • Lifetime alignment guarantee

Smooth Workflow

Dynamic Beam Optimisation

Dynamic Beam Optimisation ensures the highest data quality, with unmatched counting statistics and peak-to-background ratios, without manual instrument reconfiguration.

The high speed energy-dispersive detector (LYNXEYE XE-T) uniquely combines fast data collection with unprecedented fluorescence and Kβ radiation filtering. Its proprietary Variable Active Detector Window and Motorised Anti-Scatter Screen (MASS) enable data collection from the lowest 2Th angles without parasitic low-angle background scattering, in particular air scattering. Fully automated MASS retraction avoids beam cropping, even in combination with continuously variable slits for excellent counting statistics across the entire range.

  • Fast data collection and high throughput.
  • Superior data quality for pharmaceutical, clay, zeolite samples and more, with no parasitic low-angle background scattering.
  • Best peak-to-background ratio for greater sensitivity in minor phases.
  • Full quantification of crystalline and amorphous phases.

Dynamic Beam Optimisation

NIST SRM 8486 (Ordinary Portland Clinker). With (red) and without (blue) Motorised Anti-Scatter Screen.

TRIO – Three in One Optics

New TRIO™ optics are key component of the new D8 ADVANCE Plus. A single optic can meet the needs of all three most commonly used X-ray diffraction geometries:

  • Divergent beam for conventional powder diffraction (XRPD)
  • High intensity parallel beam for:
    • Capillary experiments
    • Height insensitive measurements,
    • Surface sensitive grazing incidence geometry (GID)
    • Coating thickness determination (XRR)
    • Micro-diffraction (μXRD)
  • Pure Cu-Kα1 parallel beam for high resolution diffraction (HRXRD) of epitaxial thin films and low symmetry powder samples

Switch easily between beam geometries. Instrument alignment is fully software-controlled, requiring no user intervention.

D8 Advance TRIO optics

D8 ADVANCE XRD with TRIO optics

Modular System

Known as Bruker’s “DAVINCI design”, the D8 ADVANCE is a completely flexible, modular XRD system. It can be adapted easily to any XRD application.

Change easily from one beam geometry to another and exchange individual components, including the the X-ray tube, optics, sample stages and detectors.

  • Push-button TWIN or TRIO optics changing with software control
  • Switch optics and wavelengths easily with SNAP-LOCK
  • Real-time component recognition and status display
  • Convenient solutions for sample mounting and positioning

Optics changing

Change optics easily with SNAP-LOCK

XRD software

Software controlled optics changing

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