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Add 4D STEM diffracton to your in-situ TEM camera

Perform a variety of 4D STEM experiments, including strain mapping, indexing, orientation mapping, virtual apertures, and differential phase contrast. The STEMx collects data through hardware synchronisation with Gatan in-situ cameras, to add 4D STEM diffraction to your toolbox.

  • New applications with your existing in-situ camera
  • Scan large areas with high diffraction space resolution
  • Preliminary results in  less than 10 minutes

Complete Control from a Single Display

Once a diffraction pattern is generated for each data point, you can view and manipulate all information from a 4D STEM diffraction cube using a single display. This includes diffraction planes and individual diffraction patterns for each pixel. STEMx processes large datasets in minutes, using data size reduction methods that include binning in four dimensions, sub-sampling the spatial domain and selecting small regions of interest.

With both acquisition and analysis in a single software display, you can analyse and assess results quickly at the microscope. Decide straight away whether to modify acquisition parameters or capture a completely new dataset.

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Gatan Stemx 4D STEM System


  • Strain mapping
  • Orientation mapping
  • Indexing (offline)
  • Virtual apertures
  • Differential phase contrast


  • Enhance the capabilities of your in-situ camera
  • Access a wealth of 4D STEM data
  • Handle large data sets easily
  • Fast results in less than 10 mins

Analysis Tools

Get the most out of your information-rich 4D data sets with integrated analysis tools.

Strain Maps

Calculate high-resolution strain maps with a reference diffraction pattern (DP) automatically generated from an unstrained area of the sample. This is then compared to all diffraction images in the dataset. This enables you to evaluate dimensional changes in a crystal lattice  to understand material growth and structural integrity.

4D diffraction strain image

Strain maps calculated from a 4D STEM dataset, acquired at 400 fps using the K2 IS camera with STEMx. The dataset included approx. 65,000 diffraction
patterns, collected in about 160 s. Figure courtesy of J. Ciston and
C. Ophus (NCEM). Courtesy of C. Nelson, S. Hsu & R. Ramesh, UC

Virtual Apertures

Generate unique virtual aperture images from distinct reflections in the data set. Simply select a reflection with a region of arbitrary shape, then combine the virtual apertures from one or more reflections. By overlaying images, you can study grain orientation from actual or theoretical constructs. You can also predict their impact on the material’s electrical and thermal conductivity.

Virtual aperture

Virtual aperture workflow: (a) Highlight a reflection with a virtual aperture of arbitrary shape; (b) Reconstruct a diffraction image using that virtual aperture; (c) Generate an RGB overlay from several apertures,eg to highlight grain orientation. This dataset was collected with the OneView IS camera using a copper foil sample. Courtesy of Dr. Geiss, Colorado State University.


Combine with Spectrum Imaging

When combined with spectrum imaging, STEMx also enables you to spatially resolve the distribution of diffraction patterns relative to electron energy loss spectroscopy or cathodoluminescence data. You can then create a comprehensive dataset that includes qualitative compositional or chemical maps and profiles.

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