Acquire a wealth of information.
For electron microscopes with scanning mode
Acquire detailed analytic data from your sample using an electron microscope with scanning mode, with the Gatan STEMPack system. Multi-modal data in scanning mode gives you a wealth of information from precise positions within a scanned image or line profile. This is the basis for a range of techniques known as spectrum imaging (SI).
Acquire a wealth of information.
With high spatial resolution.
To help you achieve excellent results.
Acquire almost any signal produced in the electron microscope.
Spectrum imaging acquires the maximum possible information from a specific area of the sample. The procedure is fully automated. STEMPack is compatible with a range of detectors including:
The spectral data is analysed with powerful processing and visualisation processes to uncover unique details. The detail of the spectral information, together with the high spatial resolution makes this an extremely powerful electron microscopy technique
