From techniques where the signal is generated near the surface.
The Gatan Ilion II is a broad beam argon milling system. Produce cross sections and planar polish samples for SEM (Scanning Electron Microscopy), EBSD, cathodoluminescence and analytical techniques where the signal is generated near the surface.
From techniques where the signal is generated near the surface.
With low energy milling
In real time.
With easy-to-use recipes.
Suitable for polishing a wide range of materials, including samples consisting of multiple elements and alloys with a range of mechanical hardness, size and physical characteristics.
With Gatan’s WhisperLok technology, you can load and unload without venting the chamber. An optional temperature controlled liquid nitrogen cooling stage is available to protect temperature-sensitive samples.
Take a look at our range for metals analysis and process control in production.
We offer a range of instruments for elemental and mineral analysis, mapping and imaging in geology and geoscience.
View all solutions for polymer analysis.
How to get better EBSD results by using ion milling to prepare samples, with the example of how to remove oxide layers from alloys
