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Vulcan Cathodoluminescence Detector

Gatan

Vulcan Cathodoluminescence Detector

Study optical and electronic properties

Characterise the luminescence properties of materials at the nanoscale with the Gatan Vulcan cathodoluminescence detector. Collect, detect and analyse cathodoluminescence (light) with your TEM.

  • Use with most mainstream TEM/STEMs
  • Analyse luminescence from a wide range of samples
  • Correlate sample morphology and micro-structure with luminescence properties
  • Measure the electronic properties of luminescent materials at meV energy resolution, including:
    • Band gap
    • Defect and quantum confinement effects in semiconductors
  • Reveal surface plasmon resonance modes of nanoparticles in any STEM
  • Cooled sample holder for enahnced efficiency, less damage and reduced line width of spectral features
  • Compatible with Gatan EELS systems for correlation of absorption and emission processes

Contact us for more information and quotes:
+44 (0)1223 422 269 or info@blue-scientific.com

Gatan Vulcan

 

Applications

  • Optoelectronic materials
  • Optoelectronics devices
  • Plasmonics
  • Photovoltaics
  • Phosphors
  • Fluorescent nanoparticles

Benefits

  • Correlate luminescence with microstructure and chemical properties
  • Analyse a wide range of samples
  • Combine with other techniques

Gatan Vulcan Cathodoluminescnece Detector for TEM

Compatible with other Techniques

The Vulcan cathodoluminescence system can be used with most standard imaging and analysis techniques, including EELS (Electron Energy Loss Spectroscopy).

When not in use, the hardware can be completely removed from the microscope. The system is compatible with other Gatan hardware, so you can perform multi-signal spectrum imaging with complementary CL and EELS and/or EDS. Use with Gatan Microscopy Suite software.

EELS and cathodoluminescence

Cathodoluminescence and EELS analysis of a gold prism (250 nm side length). (a) STEM dark field image; (b) Cathodoluminescence total light intensity map. The prism is indicated by a black dotted line; (c) Comparison of CL and EELS spectra in TEM/STEM with FEG electron source. The tail of the EELS zero loss peak (FWHM 0.65 eV) is convoluted with the surface plasmon resonance mode obscuring information. CL is an emission spectroscopy and is not affected by energy spread from the primary electron beam.

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