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TS 75 TriboScope

Bruker Hysitron

Bruker Hysitron TS 75 TriboScope

In-Situ Nanomechanical Testing for AFM

The Bruker’s Hysitron TriboScope expands the capabilities of atomic force microscopes to include quantitative nanoindentation and nanotribological characterisation.

  • Interfaces with Bruker Dimension Icon, Dimension Edge and MultiMode AFMs
  • Nanometre-precision test placement accuracy
  • Observe post-test material deformation behaviour with in-situ SPM imaging
  • Rigid probe: more reliable, repeatable and simpler than cantilever-based testing
  • Measure elastic modulus, hardness, creep, stress relaxation, fracture toughness and viscoelastic properties
  • Nanometre-to-micrometer length measurement

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Hysitron TS75 TriboScope

Applications

  • Nanomechanical and nanotribological characterisation
  • Wide range of materials
    • Soft polymers
    • Ultra-thin diamond films

Benefits

  • Expand the capabilities of your AFM
  • Nanometre-precision test placement accuracy
  • Observe post-test material deformation behaviour
  • Nanometre/micrometre scale characterisation

Testing Modes

Nanomechanical Testing Modes

Quasi-Static Nanoindentation

Study localised microstructures, interfaces, small surface features and thin films:

  • Elastic modulus
  • Hardness
  • Creep
  • Stress relaxation
  • Fracture toughness

In-Situ SPM Imaging

Use the same test probe for testing and topographic imaging:

  •  Accurate test placementwith nanometre precision
  • Characterise post-test material deformation behaviour

ScanningWear

Raster scan the test probe over the sample surface:

  • Adjust the force set-point
  • Quantitative wear resistance characterisation at the nanoscale

NanoScratch

Exclusive 2D lateral force transducer technology:

  • Quantitative scratch/mar resistance
  • Friction coefficient
  • Thin film adhesion measurements

Dynamic Nanoindentation (nanoDMA III)

Continuously measure elastic-plastic and viscoelastic properties as a function of:

  • Indentation depth
  • Frequency
  • Time

Benefits of Rigid Probes

Compliant cantilevers are used in most AFMs for mechanical and tribological testing. It can be tricky to distinguish the cantilever’s flexural and rotational stiffness from the sample’s response to stress.

The TS75 TriboScope has a rigid test probe assembly instead. This is simpler and more reliable, because force and displacement can be controlled and measured directly.

Rigid probe AFM

Cantilever versus rigid probe measurement

Accurate Nanoscale Characterisation

Characterise your material’s properties to the bottom of the nanoscale, with industry-leading noise floors and low thermal drift. Benefit from Bruker’s proprietary electrostatic force actuation and capacitive displacement sensing transducer technology for accurate results.

Fast Response

The TriboScope responds quickly to material deformation transient events and accurately reproduces requested test functions, withclosed-loop force and displacement control and a 78 kHz feedback loop rate.

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