PHI nanoTOF II with Parallel Imaging MS/MS Video
PHI nanoTOF II with Parallel Imaging MS/MS
Identifying peaks in TOF-SIMS analysis often involves educated guesses based on expertise and experience. New parallel imaging MS/MS technology from Physical Electronics (PHI) removes this ambiguity, so that peaks can now be identified with certainty.
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PHI nanoTOF II Interview Video
The new PHI nanoTOF II with Parallel Imaging MS/MS is creating a great deal of excitement in the TOF world, since its first installation at Maastricht University last December. The instrument is being used by a department specialising in the development and application of state-of-the-art mass spectrometry based molecular imaging approaches for nanomedicine and biomedical research. They are one of the world leaders in high resolution molecular imaging and histology
Watch a video interview with Professor Ron Heeren of Maastricht University, and hear from him first hand what it’s like to use the new nanoTOF tandem MS:
How Parallel Imaging MS/MS Works
With the new PHI nanoTOF II, patented technology has been added to the established TRIFT analyser. Peaks of interest are selected and deflected to a second TOF mass spectrometer. The process is fast and runs in parallel to normal TOF-SIMS analysis. TOF-SIMS and MS/MS data is acquired simultaneously from the same analytical volume – a powerful new method for mass spectrometry imaging.
This new MS/MS capability extends molecular identification to higher mass ions, where the mass accuracy of TOF-SIMS is not enough to identify molecular structure unambiguously.