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Protochips Fusion Select

Protochips Fusion Select

In-Situ Heating and Electrical System for TEM / SEM 

Enhance the capabilities of your electron microscope with in-situ heating, electrical and electrothermal analysis. Observe your sample’s behaviour at the nanoscale at precisely controlled temperatures and under electrical biasing.

The new Fusion Select features a patented double-tilt design for beta tilts up to ±20° with fixed probes for greater stability and accuracy.


  • Heating up to 1200°C
  • >99.5% temperature uniformity across the entire imaging area;
    56x more uniform than coil heating
  • Minimal displacement and drift
  • Up to 1000°C/ms heating/cooling rate


  • Low currents for characterising nanoscale samples
  • Highly accurate single digit picoamp measurements
  • Attoamp sensitivity for very low currents at the nanoscale
  • 4-point probing for greater flexibility
  • Over 30 sample supports for every application


  • Simultaneous heating and electrical biasing
  • Observe and measure electrical properties as a function of temperature
  • Silicon carbide heater with tungsten electrodes
  • Single software interface for controlling both modes


  • Programme electrical and/or thermal stimuli as waveforms
  • Adjust parameters during experiments
  • Observe data in real time and watch a plot of the results.
  • Synchronise images and data (optional) – and synchronise with Gatan DigitalMicrograph

Contact us for more information and quotes:
01223 422 269 or

Fusion brochure Contact us

Protochips Fusion Select

The Protochips system was integral to the success of the experiments. Repeatable image stability during heating with minimal sample drift allowed reliable acquisition of electron holograms. The steady heating and cooling rates enabled consistent repeatable experiments, which otherwise would have influenced the thermomagnetic behaviour.
Dr. Trevor Almeida, University of Glasgow


  • 2D materials and graphene
  • Nanoparticles and nanowires
  • Electrothermal analysis
  • FIB lamellae
  • …and more


  • Simultaneous heating and electrical biasing
  • Observe samples in-situ
  • Real time, nanoscale studies
  • EDS at zero alpha tilt – more info…
  • Fully customisable and easy to upgrade in future

New Features

The Fusion Select is a new version of the system, featuring a range of improvements and new functionality.

The system is now completely configurable, so you can choose only the features you need, with the potential to expand in future as you need to.

  • Patented double tilt design for beta tilts up to ±20°
  • New electrothermal e-chips
  • More electrical contacts for greater flexibility
  • Redesigned software for viewing data more easily

Full details about the new model are available here.

FIB Lamella Sample Preparation

New FIB-optimised electrical E-chips make FIB sample preparation quicker and easier than ever before.

Video Examples

Nanowire Formation

High Temperature Nanoparticle Dynamics

2D Materials Heated to 500ºC

Atomic Rearrangement of Carbide Monolayer

Environmental TEM: Ceria (CeO2)

Gold Nanoparticles at 600°C

Gold Nanoparticles on FeOx

Schott Glass Melting

AgCu Nanoparticle Heat Quench

Heating Suspended Nanoparticles In-Situ

Application Notes

Case Study: Electric-Field Assisted Sintering of ZrO2


Sintering involves forming a solid mass of material without melting it. Voids and pores often form, which weaken the material. Sintering by temperature alone requires high temperatures up to around 80% of the melting point. It’s a lengthy process that takes several hours.

Using electrical current alongside heating speeds up the process and lowers the temperature required. However, the role of current at the nanoscale is still largely unknown.

Until recently there was not a commercially available solution that could both heat and apply current to a sample within an electron microscope.

Monitoring Sintering


Researchers at University of California studied sintering mechanisms in yttria-stabilized ZrO(3YSZ). TEM and SEM images were used to monitor the micro-structural evolution of the agglomerates during densification.

They used the Protochips Fusion to apply 900 °C to the sample. The structure remained unchanged for 106 minutes. Then the temperature was raised to 1200 °C, and the pores shrank.

To see the effect of electrical current, the researchers applied a field of 500V/cm and a temperature of 900 °C. After just 4 minutes, pore shrinkage and coalescence occurred, confirming the field-assisted sintering.

“For the first time I can now simultaneously heat and apply an electric field to my sample within the electron microscope. With this system I can observe the dynamic processes and mechanisms of field assisted sintering as they occur.”
Dr. Klaus Van Bentham, University of California

Watch a 1 hour recorded webinar about advanced correlative studies with in-situ heating, spectroscopy and microscopy:

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