Select your region: UK & Ireland   /   Nordic

Solartron Materials Lab XM

Solartron Analytical

Solartron Materials Lab XM

Time Domain, AC and EIS Measurement for Materials Characterisation

Materials XM is part of Solartron Analytical’s Apps-XM range, a series of testing systems designed for specific applications.

  • High accuracy DC (IV and fast pulse) and EIS (C-V, impedance, Mott-Schottky)
  • Switch instantly DC and EIS – no need to change sample connections
  • Low frequency to 10 μHz for degradation, trap state and material purity studies
  • Multiple AC techniques including single sine, harmonic analysis (non-linear materials) and multi-sine for fast low frequency testing

Wide Range of Techniques

Materials Lab XM is a fully integrated, reference-grade time domain and AC measurement system. Time domain measurements include I-V (current voltage) characterisation as well as fast pulse techniques. AC testing techniques range from single-sine analysis to multi-sine / Fast Fourier Transform for fast low frequency analysis, to harmonics and intermodulation for testing linearity and breakdown of materials. You can also perform electrical impedance spectroscopy (EIS), admittance, permittivity and capacitance, together with integrated equivalent circuit analysis functionality.

Time domain and AC tests can be combined in test sequences, so DC and pulse waveforms can activate charge carriers, followed immediately by EIS analysis of the carriers. This functionality is unique to the Materials Lab XM.

Synchronised measurements from optical, mechanical displacement or other types of transducers can also be integrated, via an auxiliary measurement port. This expands the choice of measurements further.

Varied Temperatures

Temperature testing is also fully integrated in the software, with a range of temperature controllers that can be combined with cryostats and high temperature furnace systems. Furnaces and high temperature sample holders enable solid oxide / ionic conductor material testing at temperatures up to 1200 °C. Cryostats can be used to lower the sample time-constants into the equipment’s frequency range, or to investigate low temperature phenomena such as carrier trap states.

Contact us for more information and quotes:
01223 422 269 or


Materials Lab XM brochure Contact us

Solartron Materials Lab XM


  • Dielectrics
  • Insulators
  • Electronic materials


  • Calibrated specifically for materials characterisation
  • Competitive pricing
  • Small footprint
  • Best in class accuracy

Organic Light Emitting Diodes (OLED)

An OLED is a light emitting diode with an organic emissive electro-luminescent layer. They do not require backlighting, resulting in thinner, lighter displays with reduced power consumption. However, the lifetime and stability of the organic materials still needs improvement. Electrical characterisation can be used to test their stability and to understand the mechanisms and processes that contribute to the efficacy of these devices.

OLED testing

Cole-Cole (Nyquist) plot of the OLED operated under different DC bias voltages.


Semiconductor materials continue to receive much interest in the academic and industrial community as demand for more efficient devices and new applications increases. Electrical characterisation is a powerful, non-destructive way of analysing key properties of semiconductor materials and devices, such as:

  • Dopant density
  • Dopant profiling
  • Electron-hole recombination kinetics
  • Mobility carriers identification
  • Oxide electrical integrity

Semiconductor characterisation

C-V and Mott-Schottky plots (1/C2 vs V) of a 3N701 MOSFET. Stimulus frequency = 100 kHz, AC level = 10 mV

Dielectric Materials

Dielectric materials are non-conductors of electricity (electrical insulators) that can be highly polarised by an electrical field (ie the material’s dielectric constant). Charges within dielectric materials can be displaced from their equilibrium by an electric field. When the electric field is removed, the material returns to its original state. The time taken to do this is referred to as the relaxation period. Typical tests involve applying a varying electrical field (AC waveform) and monitoring the relaxation of the material as a function of its permittivity (capacitance and conductance) versus the applied AC frequency.

Dielectric materials testing

Solartron Materials Lab XMEIS

The Materials Lab XM incorporates one of the most versatile Frequency Response Analysers available, and can auto-sequence time domain and AC measurements without switching cables.

Single Sine Analysis

  • AC testing including impedance, capacitance and C-V/Mott-Schottky (stepped or smoothly ramped DC)
  • Ultra-high frequency resolution for characterising resonant materials

Multi-sine / Fast Fourier Transform (FFT) Analysis

  • AC testing including impedance, capacitance and C-V/Mott-Schottky (stepped or smoothly ramped DC)
  • Fast measurements across the whole frequency range, saving time and minimising errors for time-variant materials

Harmonic / Intermodulation Analysis

  • Investigate sample linearity and breakdown

Time Domain

Materials Lab XM incorporates Solartron’s latest hardware for accurate waveform generation and data acquisition.

  • Auto-sequence I-V, ramp, P-E and high-speed pulse techniques without switching cables
  • Smooth analogue voltage ramp waveforms, essential for research applications
  • Fast data acquisition up to 1 MS/s for all measurement techniques, including pulse and fast I-V

Back to Top