Surface Analysis on Insulators – Webinar 25/04/19
Join Physical Electronics’ webinar on Thursday 25th April 2019 to find out how to perform XPS, Auger and TOF-SIMS surface analysis on insulators and non-conducting materials in a wide range of research areas.Follow @blue_scientific
Surface Analysis of Insulating Materials
Often you need to analyse non-conducting samples using XPS, Auger and TOF-SIMS. These include materials in a wide range of research areas:
- Biological materials
- Ceramics and glass
- Optical coatings
- Semiconductors and dielectrics
- Photovoltaics and alternative energy materials
- Protective coatings
In addition to this, bulk conductors often form thin insulating oxide layers on their outermost surfaces. It’s therefore vital to be able to charge neutralize non-conducting samples consistently during analysis.
Find out more in Physical Electronics’ webinar on Thursday 25th April 2019 at 4pm BST. The webinar will be presented by John Newman, Director of the Analytical Laboratory at Physical Electronics USA.
The webinar will cover how Physical Electronics’ instruments charge-neutralise insulating samples, along with sample mounting methods that can help minimise these charging issues.
Register for the webinar on PHI’s website and you’ll receive a link to attend:
Blue Scientific is the official UK distributor of Physical Electronics surface analysis instruments. We’re here to help with your queries and provide quotes – just get in touch: