New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.
How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
Join Bruker for an AFM webinar on 15th November 2017 about two unique techniques for in situ, multimodal nanoscale imaging: PeakForce SECM and Force Volume SECM.
Bruker Nanomechanics Lab is a new package for nanomechanical characterisation of a wide range of materials, including hydrogels, metals & ceramics.
Come to our Bruker AFM Workshop at Nanoscience Days 2017 in Jyväskylä, Finland.
Save the date for our Nordic AFM User Meeting on Tuesday 26th September at Max IV in Sweden!
A paper has been published about imaging plant cell walls to analyse cellular structure and microfibril orientation. Atomic Force Microscopy is a useful tool in the paper and pulp industry.