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Posts Tagged ‘atomic force microscopy’

Nordic SPM Conference 2018

Nordic SPM Conference & User Meeting 2018: 10-11 October 2018

Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.

PeakForce SECM

AFM Webinar: Scanning Nanoelectrochemistry & Nanoelectrical Liquid Imaging 15/11/17

Join Bruker for an AFM webinar on 15th November 2017 about two unique techniques for in situ, multimodal nanoscale imaging: PeakForce SECM and Force Volume SECM.

Bruker Nanomechanics Lab AFM

Bruker Nanomechanics Lab – New AFM Package for Comprehensive Materials Characterisation

Bruker Nanomechanics Lab is a new package for nanomechanical characterisation of a wide range of materials, including hydrogels, metals & ceramics.

AFM

Bruker AFM Workshop at Nanoscience Days 2017 – 04/10/17

Come to our Bruker AFM Workshop at Nanoscience Days 2017 in Jyväskylä, Finland.

High resolution AFM probes

New Super Sharp AFM Probes from Bruker

Bruker has launched a range of super sharp AFM probes for imaging in air and fluid at higher resolution, delicate samples and enhanced nanoelectrical and nanomechnical characterisation. Blue Scientific is the official distributor for Bruker AFM in the Nordic region (Denmark, Iceland, Norway, Sweden and Finland). If you have any questions, please get in touch. Bruker […]

Nordic AFM User Meeting 2017

Nordic AFM User Meeting – 26th September 2017

Save the date for our Nordic AFM User Meeting on Tuesday 26th September at Max IV in Sweden!

Imaging microfibrils with AFM

Analysing Plant Cell Walls with AFM – Paper and Pulp

A paper has been published about imaging plant cell walls to analyse cellular structure and microfibril orientation. Atomic Force Microscopy is a useful tool in the paper and pulp industry.

Biological AFM Webinar: Virus Binding Sites

Join Bruker for a biological AFM webinar about imaging and mapping virus binding sites on cells, using FD curve-based AFM and the BioScope Resolve.

Correlated Atomic Force Microscopy and Raman spectroscopy

Nanoscale Analysis with AFM and Raman Spectroscopy

How to combine Atomic Force MIcroscopy (AFM) and Raman spectroscopy for enhanced nanoscale information about your sample’s structure, composition and properties.

PeakForce Tapping with Bruker AFM Microscopy

High Resolution AFM with Bruker PeakForce Tapping

PeakForce Tapping enables high resolution imaging and extends AFM to areas not previously possible. Map nanoscale properties simultaneously alongside imaging.