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Posts Tagged ‘bruker afm’

SCANDEM 2018

SCANDEM 2018 – Denmark, 25-28 June 2018

Visit us at SCANDEM 2018, a Nordic microscopy conference in Denmark.

Smart Energy Research

Webinar: AFM in Smart Energy Generation Research 17/10/17

Join Bruker for a webinar about how the latest developments in AFM can accelerate research into energy generation and storage.

Bruker Nanomechanics Lab AFM

Bruker Nanomechanics Lab – New AFM Package for Comprehensive Materials Characterisation

Bruker Nanomechanics Lab is a new package for nanomechanical characterisation of a wide range of materials, including hydrogels, metals & ceramics.

AFM

Bruker AFM Workshop at Nanoscience Days 2017 – 04/10/17

Come to our Bruker AFM Workshop at Nanoscience Days 2017 in Jyväskylä, Finland.

High resolution AFM probes

New Super Sharp AFM Probes from Bruker

Bruker has launched a range of super sharp AFM probes for imaging in air and fluid at higher resolution, delicate samples and enhanced nanoelectrical and nanomechnical characterisation. Blue Scientific is the official distributor for Bruker AFM in the Nordic region (Denmark, Iceland, Norway, Sweden and Finland). If you have any questions, please get in touch. Bruker […]

Nordic AFM User Meeting 2017

Nordic AFM User Meeting – 26th September 2017

Save the date for our Nordic AFM User Meeting on Tuesday 26th September at Max IV in Sweden!

Imaging microfibrils with AFM

Analysing Plant Cell Walls with AFM – Paper and Pulp

A paper has been published about imaging plant cell walls to analyse cellular structure and microfibril orientation. Atomic Force Microscopy is a useful tool in the paper and pulp industry.

Bruker Scanning Electrochemical Microscopy

New PeakForce SECM AFM Mode – Bruker AFM

PeakForce SECM is a new AFM mode for Bruker Dimension Icon Atomic Force Microscopes. Perform scanning electrochemical microscopy and in-situ electrical mapping in liquids.

Bruker Peakforce SECM

Webinar: Bruker PeakForce SECM (Scanning Electrochemical Microscopy)

Bruker webinar about Peakforce SECM (Scanning Electrochemical Microscopy), a new AFM mode with less than 100 nanometre spacial resolution.