How Bruker have accelerated AFM without compromising image quality – with examples of screening, dynamics and surveying an overview of your sample.
We’re now the official service partner for Bruker in the Nordic region, for their X-Ray Analysis and Nano Surface Analysis product lines. In line with this agreement, we’ve expanded with… read more →
New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
New Bruker Contour LS-K 3D optical profiler for fast, high quality surface maps and metrology data, with new technology for focus variation on samples with topography.
Visit us at the Surface Characterisation Conference in Denmark.
Visit us at SCANDEM 2018, a Nordic microscopy conference in Denmark.
Come to our Bruker AFM Workshop at Nanoscience Days 2017 in Jyväskylä, Finland.
The Bruker TriboLab CMP is a new system for small-scale Chemical Mechanical Wafer Polishing in R&D. It reproduces full-scale wafer polishing process conditions with unique characterisation features. This is a… read more →