Measuring homogeneity, cleanliness, oxygen content and more for process and quality control in the metals industry.
We’re now the official service partner for Bruker in the Nordic region, for their X-Ray Analysis and Nano Surface Analysis product lines. In line with this agreement, we’ve expanded with… read more →
New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.
Stockholm University used TXRF in life science research, publishing an article in Nature entitled “Metal-free ribonucleotide reduction powered by a DOPA radical in Mycoplasma pathogens”.
Multi-element analysis for refineries and oil manufacturers. Less expensive than WDXRF, with the same analytical performance.
How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
Join Bruker for an SC-XRD webinar about how to collect better structure analysis data with their new IDEAL software module for APEX3.
