+44 (0)1223 422 269 Contact

Posts Tagged ‘dimension icon’

Nansocale IR system

New Bruker Dimension IconIR Nanoscale IR Spectroscopy Platform

The new Bruker Dimension IconIR is a large-sample nanoscale infrared spectroscopy and chemical imaging system. It sets new standards in chemical and material property mapping with sub-10nm chemical imaging resolution.

GaN Nanowire Defects

Studying Defect Formation in GaN Structures with AFM

Lund University in Sweden recently published two scientific papers about studying defects in GaN nanowires and structures, using AFM and various complementary techniques.

Bruker NanoElectrical Lab

Electrical AFM Techniques – Bruker NanoElectrical Lab

Bruker NanoElectrical Lab is a package of nanoelectrical AFM techniques, with new DataCube modes. Complete materials characterisation & simultaneous acquisition of mechanical & electrical data. Official Nordic distributor.

Bruker Scanning Electrochemical Microscopy

New PeakForce SECM AFM Mode – Bruker AFM

PeakForce SECM is a new AFM mode for Bruker Dimension Icon Atomic Force Microscopes. Perform scanning electrochemical microscopy and in-situ electrical mapping in liquids.