Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.
Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and… read more →
With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.
The EIGER2 R 500K is a new detector for Bruker XRD systems.