Join us for a workshop on 28th June 2019 at Imperial College London, and learn how to prepare lamella on a MEMS chip for in-situ electrical characterisation.
How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.
EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.