Visit us at the annual SEMT electron microscopy meeting in London on 12th December 2018.
Lunchtime talk about cryo-EM at the University of Copenhagen on Tuesday 30th October 2018.
In-situ gas TEM made front page news on the cover of a scientific journal about catalysis. The paper presents research involving the Protochips Atmosphere 210.
Join Bruker for a webinar on 18 October 2018 about in-situ nanomechanical testing in the TEM, including how to observe materials under stress at the nanoscale.
Capture fast in-situ events and reactions at high resolution with the new Gatan K3 IS electron counting, direct detection TEM camera.
How to use your SEM for nanoprobing, with the Imina Nanoprobing Solution. Walk-through of an example measurement on 10 nm CMOS transistors on a semiconductor device.
Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.
The new Gatan Monarc sets new standards for what’s possible with an SEM-based CL detector.
EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.
Webinar about how UC Berkeley Electron Microscope Laboratory used the Gatan Rio camera to image a diverse range of biological sample in a core facility with over 200 users per year.