How to analyse layers and coatings with Raman spectroscopy, with the example of paint on coated metal.
Breakthrough technique for identifying contaminants in failure analysis and process control, using O-PTIR.
Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.
Visit our partners Imina at ESREF 2018 failure analysis conference in Denmark on 1-5 October 2018.
Join Bruker for a workshop at the Transport Museum in Coventry about battery development, covering AFM, NMR, FT-IR, XRD, micro-CT and nanomechanical testing.
Analytical techniques for process control of manufacturing involving metal powders. How XRD, XRF and micro-CT are used for failure analysis, element composition and mapping, crystalline phase identification, parts inspection and more.
Join Bruker for a webinar about different approaches to bulk quantification with micro-XRF, for those working in failure analysis, quality control, materials, metals and R&D.
Discover more about in-situ SEM (Scanning Electron Microscope) nanomechanical testing with a personal in-situ SEM nanoindentation demonstration. The demos will be held at the University of Birmingham on 28 and 29… read more →