New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.
Join Protochips for an In-Situ Microscopy Workshop at CIC NanoGUNE in San Sebastian, Spain on 15-16 November 2018.
Scientific paper published by CNRS in Physical Review Letters, with ground-breaking atomic resolution images of crystal growth and atomic step flow.
Visit us at the annual SEMT electron microscopy meeting in London on 12th December 2018.
An overview of the range of biological microscopy systems from JPK Instruments, now part of Bruker Nano Surfaces.
Visit us at MMC 2019 Microscience Microscopy Congress on 1-4 July 2019 at Manchester Central.
Capture fast in-situ events and reactions at high resolution with the new Gatan K3 IS electron counting, direct detection TEM camera.
How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.
How to use your SEM for nanoprobing, with the Imina Nanoprobing Solution. Walk-through of an example measurement on 10 nm CMOS transistors on a semiconductor device.