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Posts Tagged ‘microscopy’

In-Situ EELS in a TEM

Characterising Material Dynamics with In-Situ EELS (Electron Energy-Loss Spectroscopy)

Study changes in composition and the electronic structure at the nanoscale with in-situ EELS in your TEM.

Intro to Cathodoluminescence

Cathodoluminescence Webinar: An Introduction

Join Gatan for a webinar introducing cathodoluminescence imaging (CL) – the first of a series about the technique.

NEW Bruker Dimension-XR Scanning Probe Microscopes

New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.

Bruker AFM-nDMA

NEW: Viscoelastic AFM Measurements matching Bulk DMA (AFM-nDMA)

New AFM-nDMA AFM mode from Bruker for quantitative, nanoscale, viscoelastic measurements – for the first time.

Natural History Museum

SEMT Meeting 2018 – London, 12 December 2018

Visit us at the annual SEMT electron microscopy meeting in London on 12th December 2018.

JPK Instruments (Bruker Nano)

Biological AFM and Microscopy Systems from JPK Instruments / Bruker

An overview of the range of biological microscopy systems from JPK Instruments, now part of Bruker Nano Surfaces.

MMC 2019

MMC 2019 – Microscience Microscopy Congress, Manchester, 1-4 July 2019

Visit us at MMC 2019 Microscience Microscopy Congress on 1-4 July 2019 at Manchester Central.

Electron Counting Camera for TEM

Gatan K3 IS: World’s First Counting, Large Format TEM Camera for In-Situ Microscopy

Capture fast in-situ events and reactions at high resolution with the new Gatan K3 IS electron counting, direct detection TEM camera.

Bruker PeakForce TUNA AFM

Nanoscale Electrical and Mechanical Property Mapping with AFM

How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.

In-situ Nanomechanical Testing

In-Situ Nanomechanical Testing Modes for SEM / TEM

Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.