How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.
Serial block-face imaging is a 3D imaging technique for life science and materials. How it works, advantages of the technique, applications and example images.
Visit us at ENRIS 2017 (European Nanofabrication Research Infrastructure Symposium) on 8-9 May and NNUM 2017 (Nordic Nanolab User Meeting) on 9-10 May at the NTNU in Trondheim, Norway.
PeakForce SECM is a new AFM mode for Bruker Dimension Icon Atomic Force Microscopes. Perform scanning electrochemical microscopy and in-situ electrical mapping in liquids.
Analysing nanoparticles with TXRF trace element analysis, with examples and details of experiment set-up.
UK conference about nanoparticle characterisation on Monday 4th July 2016 at the Institute of Physics, London.
Join Bruker for a live remote webex training session about nano-electrical calibration calibration procedures and best practice, on Monday 8th February 2016 at 10 am (CET time).
Polymer analysis webinar about using AFM-IR (nanoscale IR spectroscopy) and related problem solving techniques. The webinar is on Thursday 11th December 2014 at 4pm GMT, and is hosted by Anasys… read more →
AFM-IR webinar about nanoscale IR spectroscopy for materials and life science, presented by Anasys Instruments on Tuesday 21st October at 8am PST (4pm GMT). Learn about revolutionary AFM-IR surface analysis technique… read more →