Join Physical Electronics for a webinar about analysing organic surfaces with TOF-SIMs and XPS.
Join PHI for a lunchtime seminar about XPS and TOF-SIMS (all welcome), as well as a user reception at AVS 65 in Long Beach.
Join Physical Electronics for a webinar about how TOF-SIMS MS/MS imaging provides spectra that are easier to interpret, opening up the technique to applications in industry.
Register now for the PHI User Meeting 2018 and Data Reduction Training for XPS, Auger and TOF-SIMS.
Find out more about Physical Electronics’ new XPS/HAXPES Scanning Microprobe in their webinar on 7th December.
Join PHI for a webinar about how Tandem MS makes accurate molecular identification quicker and easier.
A paper has been published about research into the tribochemistry of fuels/biofuels and how the addition of unsaturated fatty acids affects their lubrication. This work involved XPS research with a… read more →
SXI is a powerful and unique tool for XPS surface analysis, particularly useful when examining small sample features such as defects and contaminations.
The evolution of TOF-SIMS, and how the new parallel imaging MS/MS from PHI overcomes these limitations, enhancing resolution and overcoming ambiguity.