How nanoscale infrared spectroscopy can be used to measure semiconductor materials in defect and contamination analysis, and fabrication.
How Bruker have accelerated AFM without compromising image quality – with examples of screening, dynamics and surveying an overview of your sample.
Breakthrough technique for identifying contaminants in failure analysis and process control, using O-PTIR.
How to analyse microplastic particles with Raman spectroscopy. Identify polymers and measure size, shape and composition with the Renishaw Invia Raman microscope.
A scientific paper has been published about a new method for unequivocal molecular identification with TOF-SIMS, using the PHI nanoTOF II tandem MS imaging spectrometer.
Dow Fellow Dr Gregory Meyers will present an invited talk about AFM based nanoscale IR spectroscopy on polymer blends and films at ISPAC 2015, the 28th International Symposium on Polymer Analysis… read more →
Polymer analysis webinar about using AFM-IR (nanoscale IR spectroscopy) and related problem solving techniques. The webinar is on Thursday 11th December 2014 at 4pm GMT, and is hosted by Anasys… read more →