The Renishaw inVia InSpect is a new version of Renishaw’s inVia confocal Raman microscope, optimised specifically for use in forensic laboratories for trace chemical analysis.
With Renishaw’s new Correlate software module, you can combine results from various microscopy techniques for more powerful data.
How Raman spectroscopy can be used to characterise semiconductor materials. Measure defects in SiC, crystal quality, stress/strain, homogeneity and more.
How to combine Raman and nanoindentation for correlated mechanical and chemical data, delivering insights into your material’s properties.
How to analyse layers and coatings with Raman spectroscopy, with the example of paint on coated metal.
Unique features from Renishaw for mapping large areas quickly and at high resolution with Raman spectroscopy.
Join us for a webinar about the latest developments in Raman spectroscopy on Wednesday 21st June 2017: 12 noon – Iceland 1pm – UK 2pm – Sweden, Norway, Denmark 3pm – Finland Blue Scientific is the official Nordic distributor for the Renishaw Raman instruments. If you have any questions or if you’d like a quote, please get in touch: […]
