With Renishaw’s new Correlate software module, you can combine results from various microscopy techniques for more powerful data.
Upgrading your TEM camera can update your existing microscope for higher quality data, faster and easier workflows and convenient new features.
Prepare high quality samples for SEM, EDS, EBSD, cathodoluminescence, EBIC and more with the Gatan PECS II broad argon beam system.
Join us for a demo of the Gatan PECS II (Precision Coating & Etching System) in Sweden on 6-10 May 2019. Sample preparation for SEM, SPM & optical microscopy.
Cathodoluminescence (CL) is a technique for characterising composition, optical and electronic properties with data that correlates with morphology, micro-structure, composition and chemistry at the nanoscale.
Join Gatan for a webinar introducing cathodoluminescence imaging (CL) – the first of a series about the technique.
Visit us at the annual SEMT electron microscopy meeting at the Natural History Museum in London on 11th December 2019.
Visit us at the annual SEMT electron microscopy meeting in London on 12th December 2018.
Visit us at MMC 2019 Microscience Microscopy Congress on 1-4 July 2019 at Manchester Central.
Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.