Visit us at the annual SEMT electron microscopy meeting in London on 12th December 2018.
Visit us at MMC 2019 Microscience Microscopy Congress on 1-4 July 2019 at Manchester Central.
Capture fast in-situ events and reactions at high resolution with the new Gatan K3 IS electron counting, direct detection TEM camera.
How to use your SEM for nanoprobing, with the Imina Nanoprobing Solution. Walk-through of an example measurement on 10 nm CMOS transistors on a semiconductor device.
Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.
The new Gatan Monarc sets new standards for what’s possible with an SEM-based CL detector.
EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.
Data Challenges in Cryo-Electron Microscopy webinar with Gatan on Tuesday 22nd May 2018. How to deal with data storage, transfer and analysis of large data volumes.
Serial block-face imaging is a 3D imaging technique for life science and materials. How it works, advantages of the technique, applications and example images.