Posts Tagged ‘sem’

Prepare high quality samples for SEM, EDS, EBSD, cathodoluminescence, EBIC and more with the Gatan PECS II broad argon beam system.

Join us for a demo of the Gatan PECS II (Precision Coating & Etching System) in Sweden on 6-10 May 2019. Sample preparation for SEM, SPM & optical microscopy.

Cathodoluminescence (CL) is a technique for characterising composition, optical and electronic properties with data that correlates with morphology, micro-structure, composition and chemistry at the nanoscale.

Join Gatan for a webinar introducing cathodoluminescence imaging (CL) – the first of a series about the technique.

Visit us at the annual SEMT electron microscopy meeting in London on 12th December 2018.

Visit us at MMC 2019 Microscience Microscopy Congress on 1-4 July 2019 at Manchester Central.

Capture fast in-situ events and reactions at high resolution with the new Gatan K3 IS electron counting, direct detection TEM camera.

Round-up of in-situ nanomechanical testing modes for SEM and TEM microscopes, including compression, tensile, bend, electrical characterisation, heating and more.

The new Gatan Monarc sets new standards for what’s possible with an SEM-based CL detector.

EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.