Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and… read more →
Breakthrough technique for identifying contaminants in failure analysis and process control, using O-PTIR.
Unambiguously identify organic contamination on silicon wafers and micro-electronics with a AFM-IR technique, using the Bruker Anasys nanoIR3.
EBIC (Electron-Beam Induced Current) is a technique for characterising the electrical properties of semiconductor materials & devices. Reveal the subsurface electronic structure and analyse defects.
How to analyse elemental distribution in rocks with XRF. In this case study we look at columbite-tantalite (coltan) in rocks from Canada, with the Bruker S8 TIGER Series 2 WDXRF… read more →