New series of SPM microscopes from Bruker – with models for nanomechanics, electrical AFM and nanoelectrochemistry.
How Bruker’s PeakForce KPFM mode overcomes the common limitations of KPFM (Kelvin Probe Force Microscopy – also known as surface potential microscopy).
Visit us at MMC 2019 Microscience Microscopy Congress on 1-4 July 2019 at Manchester Central.
How to map current and conductivity at the nanoscale on fragile samples with AFM, without damaging them or contaminating the probe tip. Useful for lithium battery research, organic photovoltaics and carbon nanotubes.
Register now for our Nordic Scanning Probe Microscopy Conference & User Meeting on Thursday 11th October 2018 in Jyväskylä, Finland.
Nanomechanical testing with in situ SPM imaging, using the same probe to ensure test positioning accuracy and correlated results.
Visit us at MMC 2017 Microscience Microscopy Congress on 3-6 July 2017 at Manchester Central.
Combined Raman-SPM / AFM instruments are now available in the Nordic region (Sweden, Finland, Norway and Denmark) with our new partnership with Renishaw.
Visit us at the Scanning Probe Microscopy Meeting 2016 on 6-7 July 2016 at the University of Warwick.
Come to our AFM workshop on Thursday 17th March 2016 at DFM (Danish National Metrology Institute) in Denmark.