Join Physical Electronics’ webinar on Thursday 25th April 2019 to find out how to perform XPS, Auger and TOF-SIMS surface analysis on insulators and non-conducting materials in a wide range… read more →
Join Physical Electronics for a webinar about analysing organic surfaces with TOF-SIMs and XPS.
New Bruker Contour LS-K 3D optical profiler for fast, high quality surface maps and metrology data, with new technology for focus variation on samples with topography.
Visit us at NORDTRIB 2018, a Nordic conference about tribology on 18-21 June 2018 at Uppsala University in Sweden.
Visit us at the Surface Characterisation Conference in Denmark.
Find out more about Physical Electronics’ new XPS/HAXPES Scanning Microprobe in their webinar on 7th December.
Traditional material characterisation techniques (eg tensile testing) are not always reliable at the nanoscale. True nanoscale sensitivity and the capacity for quantitative analysis are key to understanding the structure and properties of nanoscale… read more →
The evolution of TOF-SIMS, and how the new parallel imaging MS/MS from PHI overcomes these limitations, enhancing resolution and overcoming ambiguity.
The amount of sliding friction between two surfaces is affected by a number of factors, one of the most obvious being surface texture. But how exactly does the roughness or… read more →
New nano-scratch option for the Bruker NanoForce nanomechanical testing system, for nanoscale scratch testing.