Join Physical Electronics’ webinar on Thursday 25th April 2019 to find out how to perform XPS, Auger and TOF-SIMS surface analysis on insulators and non-conducting materials in a wide range… read more →
Join Physical Electronics for a webinar about analysing organic surfaces with TOF-SIMs and XPS.
Join Physical Electronics for a webinar about how TOF-SIMS MS/MS imaging provides spectra that are easier to interpret, opening up the technique to applications in industry.
Register now for the PHI User Meeting 2018 and Data Reduction Training for XPS, Auger and TOF-SIMS.
Join PHI for a webinar about how Tandem MS makes accurate molecular identification quicker and easier.
A scientific paper has been published about a new method for unequivocal molecular identification with TOF-SIMS, using the PHI nanoTOF II tandem MS imaging spectrometer.
The evolution of TOF-SIMS, and how the new parallel imaging MS/MS from PHI overcomes these limitations, enhancing resolution and overcoming ambiguity.
A scientific paper has been published about TOF-SIMS parallel imaging MS/MS, using the new PHI nanoTOF II. This ground-breaking new technique enables tandem mass spectrometry with sub-micron spatial resolution for… read more →
TOF-SIMS peaks can now be identified unambiguously, with parallel MS/MS imaging with the new PHI nanoTOF II. Video interview with Maastricht University, where the first parallel imaging TOF-SIMS is installed.
TOF-SIMS (Time-Of-Flight Secondary Ion Mass Spectrometry) is a powerful surface analysis technique, providing valuable information about a range of materials. In this article we take a closer look at the technique and how TOF-SIMS works.