Measuring the thickness, roughness and density of thin films, coatings, multi-layers and superlattices.
Characterise thin films with large area reciprocal space mapping. With the Bruker EIGER2 R 500K XRD detector you can map large areas in a realistic timeframe, collecting multiple substrate and… read more →
With microdiffraction you can analyse smaller spots in-situ without grinding to a powder, for information that can be missed by powder analysis.
Register now for our Bruker XRD User Meeting on 12-13 June 2019 at Uppsala University in Sweden.
We’re now the official service partner for Bruker in the Nordic region, for their X-Ray Analysis and Nano Surface Analysis product lines. In line with this agreement, we’ve expanded with… read more →
Analytical techniques for process control of manufacturing involving metal powders. How XRD, XRF and micro-CT are used for failure analysis, element composition and mapping, crystalline phase identification, parts inspection and more.
The EIGER2 R 500K is a new detector for Bruker XRD systems.
The 14th Bruker TOPAS Users’ Meeting will be on Friday 29th June – Sunday 1st July 2018 in Edinburgh, UK. All are welcome: both TOPAS users and those interested in… read more →
New flagship of the Bruker XRD range, with powerful components for materials research and analysis.