Webinar: TOF-SIMS Molecular Identification by Tandem MS Imaging 21/09/17
Join Physical Electronics for a live webinar about TOF-SIMS Molecular Identification by Tandem MS Imaging on Thursday 21st September 2017.
In this webinar Dr. Greg Fisher, Principle Scientist at Physical Electronics will discuss the benefits of tandem MS, and how it makes accurate molecular identification quicker and easier.
Parallel Imaging MS/MS involves extracting secondary ions of choice from the TOF-SIMS data stream for fragmentation and analysis in a separate TOF analyser. This enables unambiguous peak identification and parallel tandem MS imaging capabilities.
Find out more about this new technique in PHI’s 1 hour webinar.
The live webinar will be on Thursday 21st September 2017 at 8:30am Chicago Daylight Time (2:30pm BST). Register and you’ll receive a link to attend:
PHI nanoTOF II
The instrument mentioned in the webinar is the PHI nanoTOF II with tandem MS imaging:
- Unambiguous TOF-SIMS peak identification
- Elemental, chemical and molecular imaging
- Combines sensitivity, spatial resolution and molecular specificity